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| 表面の説明 | ログイン して詳細を見る |
|---|---|
| 表面の文字体系 | ログイン して詳細を見る |
| 表面の銘文 | ログイン して詳細を見る |
| 裏面の説明 | The reverse of this control trial piece presents a plain lead surface bearing a series of concentric circular ridges radiating outward from a central raised point, a characteristic feature of Monnaie de Paris hub or die control flans used to test die pressure and planchet flow during production trials. No figurative design, legend, or denomination is present on this face, as the reverse die was not engaged during striking. The overall surface retains the natural oxidized patina of lead, with irregular flow lines consistent with the heavy weight of the flan. |
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| 縁 | ログイン して詳細を見る |
| 鋳造所 | Monnaie de Paris, Paris (and Pessac starting 1973), France (864-date) |
| 鋳造数 | ログイン して詳細を見る |
| 追加情報 |
The 50 francs Guiraud, designed by Henri Piel under the pseudonym Guiraud, entered production in 1950 as France rebuilt its coinage infrastructure after the disruptions of Occupation and Liberation. This piece is not a circulation strike but a contrôle épreuve — a quality-control trial struck in lead by the Monnaie de Paris to verify die alignment, depth, and relief before authorizing full production runs. Such pieces were internal workshop documents, never intended for release, which explains both their rarity and the casual handling they sometimes received.
The obverse die used here corresponds to GEM 221.4, a specific catalogued state within the Guiraud series.